Value Analysis Tear-Down|
Yoshihiko Sato and J. Jerry Kaufman
176 pages, Illustrated, 6 x 9
Published: December, 2004
This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few years of its public announcement in Japan, value analysis tear-down was adopted by all eleven Japanese automobile manufacturers, and many of the Japanese consumer electronics manufacturers. Jerry Kaufman, based in Houston, Texas, is a recognized authority and author on value engineering and value management, and has contributed much that is in these technologies to the process described in this book. The result of his collaboration with Mr. Sato is a process that helps engineers and managers reduce product cost, improve quality, continuously improve existing products, and discover opportunities for innovative change.
The first 'how-to-do-it' book in English, it is written specifically for professionals in product engineering, manufacturing engineering, and value engineering; and the managers of these professionals, including plant managers, production managers, manufacturing executives, and research and development executives. It will also be useful to manufacturing, marketing, and management people concerned with product improvement, innovation, and improving their company's competitive position. Value analysis tear-down can be applied in many service and other industries, as well as in manufacturing; wherever there are physical components to be improved or invented.
* Chapter 1. VA Tear-Down What Is It, How It Developed
* Chapter 2. Value Analysis and VA Tear-Down
* Chapter 3. The VA Tear-Down Process
* Chapter 4. Applying VA Tear-Down to Issues of Concern
* Chapter 5. Evaluating VA Tear-Down Results
* Chapter 6. Other Measures Of Competitiveness With VA Tear-Down
* Appendix Worksheets